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AIDC 100 Archive - William Hakanson Collection

Collection Number
SC 395

OCLC Number

William Hakanson 

William Hakanson donated the collection in spring 2005.

Extent,   Scope, and Content Note 
The collection is comprised of 5 linear inches of papers, photographs and artifacts documenting the automatic identification and data capture industry (AIDC) and produced between 1984 and 1993.

Arrangement and Processing Note
Processed by F. Jason Torre, January 2006. Finiding aid updated and revised by Kristen J. Nyitray in March 2014 and May  2019.

Series 1: Artifacts, 1984-1991.G iveaways and gifts distributed at Scan-Tech meetings.
Series 2: Papers, 1985-1993. Papers of Hakanson and photographs.


Restrictions on Access
The collection is open to researchers without restriction.

Rights and Permissions 

Stony Brook University Libraries' consent to access as the physical owner of the collection does not address copyright issues that may affect publication rights. It is the sole responsibility of the user of Special Collections and University Archives materials to investigate the copyright status of any given work and to seek and obtain permission where needed prior to publication.  

[Item], [Box], William Hakanson Collection, Special Collections and University Archives, Stony Brook University Libraries.

Historical Note
William Hakanson CAE, Executive Director, Supply-Chain Council, has served as executive director of trade associations in the manufacturing, material handling and automatic data collection industries. In 1997, he facilitated the formalization of the Supply-Chain Council from an informal interest group to a not-for-profit trade association. Concurrent with serving as executive director of the Supply-Chain Council, he is CEO of his own association management firm: Hakanson & Company, Inc. Based in Pittsburgh, PA, the Supply-Chain Council is a not-for-profit trade association with membership open to all companies interested in improving supply-chain efficiencies through the use of the SCOR. (Excerpted from Logistics Quarterly, SCOR Can Help Analyze Your Supply-Chain Operation, V. 5, I. 1 April 1999.)

Automatic identification and data capture
QR codes.
Mobile communication systems.
System identification.  
Automatic data collection systems.


Series 1: Artifacts

Box 1

SCAN-TECH EUROPE LASER POINTER. Pen shaped laser pointer, undated.
AIM USA CROSS CHROME PLATED PEN. Ball point pen in chrome, undated.
AIM USA PEN. Ball point pen in black plastic, undated.
HARTMANN LEATHER WALLET KEYCHAIN. Speaker’s gift, Scan-tech conference, undated.
AIM USA COACH LEATHER BUSINESS CARD HOLDER. Speaker’s gift, AIM conference, undated.
SHARP EL-470 TRAVEL CLOCK CALCULATOR. Clock and calculator travel set, undated.
SCAN-TECH 1984 FOLIO, READING, “The total automatic ID systems show and systems, December 4-6, Cincinnati."
SCAN-TECH 1984 GLASS EGG PAPERWEIGHT, READING, “The total automatic ID systems show and systems, December 4-6, Cincinnati.
SCAN-TECH 1985 GOLD PLATED STAPLER boxed in black cardboard case. Case reads, “El Casco – Model M -5B,” 1985.
SCAN-TECH EUROPE 1985 NOTEPAD (WITH SILVER PEN). Brown leather notepad with accompanying pen and Velcro space for calculator, etc. Dated: 1985
SCAN-TECH 1988 DUAL PEN SET. Dual, gray coated pens from the Quill Corporation, 1988.
QUICK RESPONSE 1989 NOTEPAD. Brown leather notepad. Pad reads, “Quick Response 1989, March 21-22, 1989, Hyatt Regency Hotel, DFW Airport, Dallas,” 1989.
QUICK RESPONSE 1990 LUGGAGE TAG. Brown leather luggage tag. Tag reads, “Quick Response 1990, March 20-21, 1990, Hyatt Regency Hotel, DFW Airport, Dallas,” 1990.
SCAN-TECH EUROPE 1991 CORK-SCREW, boxed in clear plastic faced, green velvet lined case. Case reads, “Der Schlussel zum guten Tropfen,” 1991

Series 2: Papers

Box 2

Shining Examples of Productivity Gain, March 1987, P & IM Review
Closed vs. Open Systems, April 1987, P & IM Review
Strong Automatic identification Initiative in non-food retailing, August 1987, P & IM Review
Quick Response Programs Impacting Warehousing and Inventory Control, August 1988, P & IM Review
AIM NEWS 1985-1993 (not inclusive)
Scan-tech 1987 (photograph) AIM International Attendees, 1987
Scan-tech 1988 (photograph) AIM International Attendees, 1988
Scan-tech 1989 (photograph) AIM International Attendees, 1989
Scan-tech 1990 (photograph) AIM International Attendees, 1990