Scanning probe microscope with hysitron attachment
Bruker Dimension ICON
Scanning probe microscope (left) 3D image of photoresist- imprinted
patterns on silicon wafer scanning by Contact mode; 2D image of
organic photovoltaic poymeric solar cell(PMMA/ P3HT/ PCBM) scanning
by PeakForce TUNA mode, showing the topography (middle) and
conductive current (right) measurement.