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transmission electron microscope (TEM)

JEOL JEM 1400

Technical Details

  • Resolution (Lattice Image/ Point Image): 0.20 nm/ 0.38 nm
  • Illumination Emitter: Precentered single-crystal LaB6 filament
  • Accelerating Voltage (Steps/ Variable steps/ Stability): 40, 60, 80, 100, 120 kV/ 33 V min. / 2 x 10-6 per min
  • Magnification (Mag mode/ Low Mag mode): x 5,000-2,000,000/ x120-4,000
  • Specimen Stage: microactie goniometer with piezo drives
  • Specimen Chamber (Specimen per Load/ specimen Tilt Angle (X-axis)): 1/ ±25˚ (±70˚ with optional holder)
  • Specimen Movements (X, Y, Z Direction): ±1.0 mm, ±1.0 mm, ±0.5 mm
  • Equipped with Anticontamination Device and Cryofin
  • Equipped with Gatan ORIUS SC1000B CCD Camera
  • Equipped with energy dispersive X-ray and Oxford X-MAX 80 T detector
  • Maximize throughput and low energy sensitivity
  • Optimized take-off angle for best peak-to-background ratios and light element detection
TEM

 

 

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