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Scanning probe microscope with hysitron attachment

Bruker Dimension ICON


Technical Details

  • Multimode:

    PeakForce Tapping
    ScanAsyst in Air/ Fluid
    Contact Mode in Air/ Fluid
    Tapping Mode in Air/ Fluid
    Scanning Tunneling Microscopy (STM)
    PeakForce QNM (Quantitative Nanomechanical Mapping)
    PeakForceTUNA
    Surface potential detection (Kelvin Probe FM)

  • Heating and Cooling
    Execute temperature control and thermal analysis on samples from -35˚C to 250˚C while scanning in various modes.
  • Resolution: 1 µm
  • Repeatability: ±2 µm
  • Scanner specifications: 90 µm X 90 µm in X-Y direction; 6 µm in Z direction
  • Sample size: ≤ 200 mm (8 inch) in diameter and ≤ 15 mm (0.65 inch) in thickness

 

Applications

  • Materials mapping
  • Nanomechanics characterization
  • Nanoelectrical characterization
  • Biological characterization

 

AFM

AFM image aAFM image bAFM image c

Scanning probe microscope (left) 3D image of photoresist- imprinted
patterns on silicon wafer scanning by Contact mode; 2D image of
organic photovoltaic poymeric solar cell(PMMA/ P3HT/ PCBM) scanning
by PeakForce TUNA mode, showing the topography (middle) and
conductive current (right) measurement.

 

                                                                                              

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